Abstract
The grain-boundary network in high- coated conductors consists of a large number of low-angle grain boundaries with many types of misorientation. Using the bicrystal technology we have measured the critical current densities of the relevant grain boundaries as a function of the grain-boundary angle. We find that in the low-angle regime [010]-tilt boundaries and [100]-twist boundaries reduce the critical current density much less than [001]-tilt boundaries. Transmission electron microscopy reveals a low defect density in the [010]-tilt boundaries and we find that planes cross these boundaries without interruption.
- Received 17 October 2008
DOI:https://doi.org/10.1103/PhysRevB.79.014515
©2009 American Physical Society