Low-angle grain boundaries in YBa2Cu3O7δ with high critical current densities

R. Held, C. W. Schneider, J. Mannhart, L. F. Allard, K. L. More, and A. Goyal
Phys. Rev. B 79, 014515 – Published 23 January 2009

Abstract

The grain-boundary network in high-Tc coated conductors consists of a large number of low-angle grain boundaries with many types of misorientation. Using the bicrystal technology we have measured the critical current densities of the relevant YBa2Cu3O7δ grain boundaries as a function of the grain-boundary angle. We find that in the low-angle regime [010]-tilt boundaries and [100]-twist boundaries reduce the critical current density much less than [001]-tilt boundaries. Transmission electron microscopy reveals a low defect density in the [010]-tilt boundaries and we find that CuO2 planes cross these boundaries without interruption.

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  • Received 17 October 2008

DOI:https://doi.org/10.1103/PhysRevB.79.014515

©2009 American Physical Society

Authors & Affiliations

R. Held, C. W. Schneider, and J. Mannhart

  • Experimentalphysik VI, Center for Electronic Correlations and Magnetism, Institute of Physics, Augsburg University, 86135 Augsburg, Germany

L. F. Allard, K. L. More, and A. Goyal

  • Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

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Vol. 79, Iss. 1 — 1 January 2009

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